The Phenom Pharos G2 Desktop FEG-SEM delivers an image quality unexpected from a tabletop tool. The resolution of 1.5 nm resolves details that other SEMs might miss. The Phenom Pharos G2 Desktop FEG-SEM also supports lower voltages, enabling imaging of beam-sensitive samples, such as polymers, as well as insulating samples, without the need to apply a coating. As a result, nanoscale surface features are not obscured.
Product model | Phenom Pharos G2 | Phenom XL G2 | Phenom ProX G6 |
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Full name of the product | Pharos G2 Desktop FEG-SEM | Phenom XL G2 Desktop SEM | Phenom ProX Desktop SEM with EDS |
Light optical | 27 - 160 X | 3 - 19 X | 27 - 160 X |
Electron optical | 350,000 X | 200,000 X | 350,000 X |
Resolution | < 1.5 nm | ≤ 8 nm | ≤ 6 nm |
Electron source | Schottky Field Emission source | Long lifetime thermionic source (CeB6) | Long lifetime thermionic source (CeB6) |
Color navigation camera | Color | Color navigation camera | Color |
Acceleration voltages | 4.8 kV - 20.5 kV | 4.8kV - 20.5kV | 4.8 kV - 20.5 kV |
Vacuum Mode | Integrated low-/medium-/high-vacuum modes standard | Low - Medium - High | Low - High |
Detector | BSD SED EDS (Optional) |
BSD SED (Optional) EDS (Optional) |
BSD SED(Optional) EDS |
Download Center | Product Brochure | Product Brochure | Product Brochure |
Completely shockproof
Convenient parameter settings
Easy to operate
Color navigation camera
Loading samples
Desktop SEM with EDS
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