The Phenom ParticleX Desktop SEM for additive manufacturing enables automated scanning electron microscopy EDS. It is the proven solution for monitoring the three most critical characteristics of metal powders for powder-bed and powder-fed additive manufacturing processes: particle size distributions, individual particle morphology and foreign particles.
Product model | ParticleX | ParticleX Battery | ParticleX Steel |
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Full name of the product | ParticleX | ParticleX Battery | ParticleX Steel |
Light optical | 3 - 19 X | 3 - 19 X | 3 - 19 X |
Electron optical | 200,000 X | 200,000 X | 200,000 X |
Resolution | ≤ 8 nm | ≤ 8 nm | ≤ 8 nm |
Electron source | Long lifetime thermionic source (CeB6) | Long lifetime thermionic source (CeB6) | Long lifetime thermionic source (CeB6) |
Color navigation camera | Color | Color | Color |
Acceleration voltages | 4.8 kV - 20.5 kV | 4.8 kV - 20.5 kV | 4.8 kV - 20.5 kV |
Vacuum Mode | Integrated low-/medium-/high-vacuum modes standard | Integrated low-/medium-/high-vacuum modes standard | Integrated low-/medium-/high-vacuum modes standard |
Detector | BSD SED(Optional) EDS |
BSD SED(Optional) EDS |
BSD SED(Optional) EDS |
Fully automatic function | Automated powder analysis | Fully automatic analysis of battery | Fully automatic analysis of steel |
Download Center | Product Brochure | Product Brochure | Product Brochure |
Completely shockproof
Convenient parameter settings
Easy to operate
Color navigation camera
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Desktop SEM with EDS
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