Hotline：400-857-8882
For the understanding of a work of art or archaeological cultural relics, it is necessary to study from all aspects, and mastering its structure and chemical composition can help researchers trace the production process and raw materials of cultural relics, and provide ideas for the protection and restoration of cultural relics. Phenom SEM can provide non-destructive detection methods to help the study of microscopic morphology and chemical composition of cultural relics.
Phenom desktop SEM feature patented anti-vibration technology and can be placed in various environments, such as FA lab, high-rise office buildings, even next to production lines, allowing on-site sampling and observation.
Load samples in one step, evacuate in 15 seconds, and achieve images in 30 seconds. Helpful in fast sample filtering, analysis position and the sample's pre-processing result confirming.
Simplifies the sample preparation process and suitable for various types of semiconductor materials.
Excellent low voltage imaging capability, maximally restoring the true morphology of the sample.
If you want to learn more about product information, please fill out the following information to download the product manual. We will reply to you as soon as we receive your message.
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