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Ceramic Materials
Phenom Desktop SEM
Scanning Electron Microscope

Particle size and specific surface area are important indicators to describe the performance of powders during the production process. However, the corresponding relationship between powder particle size and specific surface area is relatively complex and is greatly affected by its shape factor and particle size distribution. With the help of scanning electron microscope (SEM), the micromorphology of powder raw materials can be easily analyzed to describe the relationship between its particle size and specific surface area.

Placement without any Additional Environmental Requirements
Placement without any Additional Environmental Requirements

Phenom desktop SEM feature patented anti-vibration technology and can be placed in various environments, such as FA lab, high-rise office buildings, even next to production lines, allowing on-site sampling and observation.

Easy Operation
Easy Operation

Load samples in one step, evacuate in 15 seconds, and achieve images in 30 seconds. Helpful in fast sample filtering, analysis position and the sample's pre-processing result confirming.

Observing Directly in Low Vacuum for Non-conductive Materials
Observing Directly in Low Vacuum for Non-conductive Materials

Simplifies the sample preparation process and suitable for various types of semiconductor materials.

Low Acceleration Voltage
Low Acceleration Voltage

Excellent low voltage imaging capability, maximally restoring the true morphology of the sample.

Phenom Desktop SEM
SEM Image
BeO Ceramic
BeO Ceramic
MLCC
MLCC
SiN Powder
SiN Powder
Zirconia Ceramic
Zirconia Ceramic
Alumina Ceramic
Alumina Ceramic
Industry News
Industry dynamics
Phenom XL G2 Desktop SEM
Phenom XL G2 Desktop SEM

Phenom ProX Desktop SEM with EDS
Phenom ProX Desktop SEM with EDS

Phenom Pro G6 Desktop SEM
Phenom Pro G6 Desktop SEM

Phenom Pure G6 Desktop SEM
Phenom Pure G6 Desktop SEM

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